
杨杰可靠性测试参考表(模块)
2023-03-27 15:25:35
晨欣小编
序号 | 试验项目 (Test Item) | 试验条件 (Condition) | 抽样数 (Sample size) | 判定标准 (Decision) | 试验依据 (Reference) |
1 | 高温反偏 (High Temperature Reverse Bias) | a、Voltage:80% Rated Voltage; b、Time:168h/1000h; c、Temperature:Fast Recovery Diode or Thyristor:125℃; Discrete Device,MOSFET or IGBT:145℃; Rectifier Diode:150℃. | 5PCS(FG) | LSL≤Electrical Parameter≤USL | IEC 60747 |
2 | 高温栅偏 (High Temperature Grating Bias) | a、Voltage: ±VGSmax/VGEmax; b、Temperature:Tstgmax ; c、Time:168h/1000h. | 5PCS(FG) | LSL≤Electrical Parameter≤USL | IEC 60747 |
3 | 温度循环 (Temperature Cycling) | a、Temperature:Low Temperature -55℃ for 30min; High Temperature 150℃ for 30min; b、Conversion Time:10s; c、Cycle Times:10Times/100Times. | 5PCS(FG) | LSL≤Electrical Parameter≤USL | IEC 60068-2-14 Test Na |
4 | 恒温恒湿 (Constant Temperature and Humidity ) | a、Temperature:85℃; b、Humidity:85% RH; c、Time:168h/1000h. | 5PCS(FG) | LSL≤Electrical Parameter≤USL | IEC 60068-2-67 |
5 | 功率循环 (Power Cycling) | a、ΔTJ=100℃+15/-10℃; b、Cycle Times:100Times/1000Times. | 5PCS(FG) | LSL≤Electrical Parameter≤USL | IEC 60749-34 |
6 | 高温存储 (High Temperature Storage) | a、Temperature:Tstgmax ; b、Time:168H/1000H. | 5PCS(FG) | LSL≤Electrical Parameter≤USL | IEC 60068-2-2 |
7 | 低温存储 (Low Temperature storage) | a、Temperature:Tstgmin; b、Time:168H/1000H. | 5PCS(FG) | LSL≤Electrical Parameter≤USL | IEC 60068-2-1 |
8 | 冲击试验 (Shock Test) | a、Max.:50G; b、Pulse Time:6ms,Sine Half Wave; c、Dir.: X / Y / Z,3 Positive and 3 Negative Impacts, 18Times in total. | 5PCS(FG) | LSL≤Electrical Parameter≤USL | IEC 60068-2-27 Test Ea |
9 | 震动试验 (Vibration Test) | a、Vibration Waveform:5~200 Hz,Sine Wave; b、Acceleration: 5g; c、Direction of Vibration:x, y, z d、Vibration Time:Frequency Sweep:5Hz~200Hz~5Hz, 1min, 2H per axle | 5PCS(FG) | LSL≤Electrical Parameter≤USL | IEC 60068-2-6 Test Fc |